EBK OPERATIONS MANAGEMENT
EBK OPERATIONS MANAGEMENT
14th Edition
ISBN: 9781260718447
Author: Stevenson
Publisher: MCG COURSE
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Chapter 10, Problem 21P

a)

Summary Introduction

To determine: The capability index of the process.

Introduction: Quality is a measure of excellence or a state of being free from deficiencies, defects and important variations. It is obtained by consistent and strict commitment to certain standards to attain uniformity of a product to satisfy consumers’ requirement.

b)

Summary Introduction

To determine: Whether the process is capable.

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A process that produces computer chips has a mean of .04 defective chip and a standard deviationof .003 chip. The allowable variation is from .03 to .05 defective.a. Compute the capability index for the process.b. Is the process capable?
6-9. A process that produces computer chips has a mean of .04 defective chip and a standard deviation of .003 chip. The allowable variation is from .03 to .05 defective. (a) Compute the capability index for the process (b) Is the process capable?
1. The overall average on a process you are attempting to monitor is 55.0 units. The process population standard deviation is 1.84. Sample size is given to be 16. ​a) Determine the ​3-sigma x​-chart control limits.   Upper Control Limit ​(UCLx​)=56.3856.38 units ​(round your response to two decimal​ places). Lower Control Limit ​(LCLx​)=53.6253.62 units ​(round your response to two decimal​ places). ​b) Now determine the ​2-sigma x​-chart control limits.   Upper Control Limit ​(UCLx​)=? units ​(round your response to two decimal​ places).       2.  Sample ​Size, n Mean​ Factor, A2 Upper​ Range, D4 Lower​ Range, D3 2 1.880 3.268 0 3 1.023 2.574 0 4 0.729 2.282 0 5 0.577 2.115 0 6 0.483 2.004 0 7 0.419 1.924 0.076 8 0.373 1.864 0.136 9 0.337 1.816 0.184 10 0.308 1.777 0.223 12 0.266 1.716 0.284 ​Thirty-five samples of size 7 each were taken from a​…
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